ÈÑÒÈÍÀ

Markiewicz P.

Ñîàâòîðû: Cohen S.R., Bukharaev A.A., Ovchinnikov D.V., Efimov A.

1 ñòàòüÿ

Êîëè÷åñòâî öèòèðîâàíèé ñòàòåé â æóðíàëàõ ïî äàííûì Scopus: 18

IstinaResearcherID (IRID): 1205455

Äåÿòåëüíîñòü ñòèëü:  îáû÷íûé | ÃÎÑÒ | plain | abbrv | acm | alpha | amsalpha | amsplain | apalike | ieeetr | siam

• Ñòàòüè â æóðíàëàõ

  • 
    • 1999 Spm tip visualization through deconvolution using various characterizers: optimization of the protocol for obtaining true surface topography from experimentally acquired images
    • Markiewicz P., Cohen S.R., Efimov A., Ovchinnikov D.V., Bukharaev A.A.
    • â æóðíàëå Probe Microscopy, òîì 1, ñ. 355