High-Temperature Tests for Graphite Composites on the Basis of Isotope ¹³C and Natural Graphite to Forecast the Lifetime of a Neutron Target

E.I.Zhmurikov, A.I.Romanenko, O.G.Abrosimov, O.V.Anikeeva, K.V.Gubin, P.V.Logachev, Tecchio Luigi

Properties of GaAs/InGaAs Quantum-Size Structures Containing δ<Mn>-Doped Layers

O.V.Vikhrova, Yu.A.Danilov, Yu.N.Drozdov, B.N.Zvonkov, F.Iikawa, M.J.S.P.Brasil

Structure of Thin Al₂O₃ Layers Synthesized on Silicon Surface by Atomic Layer Deposition Methods

S.V.Bukin, A.S.Shulakov

Account of Focused Intensity Losses Channels for Refractive Optic Devices

L.G.Shabel'nikov

Experimental Study of PDI Possibilities for the Control of Optical Elements Form

A.Yu.Klimov,E.B.Klyuenkov, A.L.Mizinov,E.L.Pankratov, V.N.Polkovnikov, N.N.Salashenko, E.D.Chkhalo, N.I.Chkhalo, N.B.Voznesenskii

Intrinsic Symmetry of Refracting Profiles Derived from Parabol

V.V.Aristov, L.G.Shabelnikov

Nonlinear Properties of Two-Dimensional Semiconductor Superlattices in Biharmonic Fields

Yu.Yu.Romanova,A.A.Ryzhova, Yu.A.Romanov, I.V.Keleinov

Study of Degradation Mechanism of Ultrathin HfO₂ Layers on Silicon during Vacuum Annealing by Atomic Force Microscopy

A.S.Baturin, A.V.Zenkevich, Yu.Yu. Lebedinskii, N.Yu.Lubovin, V.N.Nevolin, E.P.Sheshin

Peculiarities of Adhesion Properties of Films on Ion-Doped Device Structures

V.P.Astakhov, V.V.Karpov, V.V.Krapukhin, A.D.Maksimov, V.S.Tulovchikov, D.I.Tetelbaum

Absolutly Calibrated Device for Measurement of EUV Power Suitable for Certification

of Radiation Source in the 13.5 nm Range

I.G.Zabrodin, B.A.Zakalov, S.Yu.Zuev, I.A.Kaskov, E.B.Klyuenkov,A.Ya.Lopatin, N.N.Salashenko,L.A.Suslov, A.E.Pestov, N.I.Chkhalo,L.A.Shmaenok

Polarization Correction to the Energy Gap in Silicon Nanocrystals

V.A.Burdov

Ground State of Electrons and Holes in a Silicon Quantum Dot with Shallow Donor

V.A.Belyakov, V.A.Burdov

Off-Plane Grazing Incidence Blazed Grating with Radial Groove Geometry as an Efficient Spectral Purity Filter for EUV Lithography

L.I.Gorai

Formation of X-Ray Images by means of Thermal Action of Light Beam on the Crystal

Surface during Diffraction

V.N.Trushin, A.S.Markelov, E.V.Chuprunov, A.A.Zholudev

Station DICSI at KCSR and NT. The Definition of Optimal Requirements to Formation of SR-Beam Using Cylindrical X-Ray Optical Zoom Tenses

V.N.Korneev, P.M.Sergienko, V.A.Shlektarev, V.M.Aul'chenko, V.A.Bukin, V.M.Titov, B.P.Tolochko, M.R.Sharafutdinov, A.V.Zabelin, E.I.Litvinov, A.M.Matyushin, V.G.Stunkevich, M.A.Sheromov, O.V.Naida, A.A.Vazina

Investigation of Fuel Cladding Tube Zirconium Surface by AFM and TEM

T.M.Poletika, E.V.Yudina, S.L.Girsova, N.V.Girsova

Magnetic Properties of the Multiwall Carbon Nanotubes and Astralenes in High Level Electronic Fields

, A.N.Brozdnichenko, A.N.Ponomarev, V.P.Pronin, V.V.Rybalko

Possibilities and Prospects of Irradiated Constructional and Fuel Materials Investigation with Application of Scanning Electron Microscope Philips XL 30 ESEM-TMP Installed in the Hot Cell

V.N.Golovanov, A.E.Novoselov, S.V.Kuzmin, V.V.Yakovlev

Accounting Lines Overlapping and Background Approximation in Energy Dispersive XRF and Microprobe Analyses

A.T.Savichev, S.S.Stepanov

Features of the Isotope Distribution Examination in Materials with High Sheet Resistance Using Secondary Ion Mass Spectrometry Method

Yu.D.Goncharenko, L.A.Evseev

Intense Radiation from a Relativistic Electron Rotating about a Dielectric Ball

M.L.Grigoryan

Electrodeposition and Properties of Galvanic Coatings of Molybdenum (Tungsten) -Nickel (Cobalt)

V.V.Malyshev

Уточнение положения атомов водорода в (NH₄)₂SeO₄

A.Loose, G.Melnyk, N.Zink, K.Wozniak, P.Dominiak, Л.С.Смирнов, A.Pawlukoje,

½ Л.А.Шувалов½