Документ взят из кэша поисковой машины. Адрес оригинального документа : http://www.nano.msu.ru/files/research/Antwerpen/Application_form_2010.doc Дата изменения: Mon Nov 1 15:01:46 2010 Дата индексирования: Mon Oct 1 20:26:14 2012 Кодировка: Поисковые слова: composite image

[pic] |Nanotechnology Education and Research Center
Leninsky gory, 119991, GSP-1, Moscow, Russian Federation
EMAT, University of Antwerp, Groenenborgerlaan 171, B-2020 Antwerp, Belgium
|[pic] | |Application for transmission electron microscopy investigation at
EMAT

Form A - Administrative data

1. Proposer.
|First name, middle initial, last name: |
|_________________________________________________________________________________|
|___________ |
|Department and division: |
|_________________________________________________________________________________|
|___________ |
|Position: |
|_________________________________________________________________________________|
|___________ |
|Contact information: |
|Phone:___________________ Fax:_________________________ |
|E-mail:____________________________ |

|Proposal ID number (filled by NERC):_______________________ |
| |
|Receiving date (filled by NERC):___________________________ |

Form B - Proposal information

1. Proposal title
|max. 200 characters |

2. Description of research (include scientific background, goals and
references)
|max. 2 pages |

3. Specify the required microscopy technique. Check all that apply.
|Conventional imaging: |
|Bright field TEM imaging |
|Dark field TEM imaging (specify imaging conditions) |
|Scanning transmission electron microscopy (STEM) imaging |
| |
|High resolution imaging: |
|High resolution TEM imaging (200 - 300 kV) |
|High resolution TEM imaging (400 kV) |
|High resolution STEM imaging |
| |
|Electron diffraction: |
|Selected area electron diffraction (SAED) |
|Microdiffraction |
|Convergent beam electron diffraction (CBED) |
|Precession electron diffraction (PED) |
| |
|Analytical electron microscopy: |
|Qualitative energy-dispersive X-ray analysis (EDX) |
|Quantitative energy-dispersive X-ray analysis (EDX) |
|Electron energy loss spectroscopy (EELS) |
|Energy-filtered TEM (EFTEM) |
| |
|In-situ TEM (provide temperature ranges for observations, melting temperature of |
|the sample, its stability under vacuum at elevated temperature) |
|Cooling L(N2) holder |
|Heating holder |

4. Sample preparation. Check all that apply.
| |
|Mechanical polishing Ion milling Electropolishing Focused ion beam (FIB) |
|Powder on carbon grid Cross-section Plan view Cryomicrotome |
| |
|Provide more detailed description of the sample preparation (if necessary, max |
|1/2 page): |

5. Sample information. Check all that apply.
| |
|Polycrystalline Amorphous Ceramic Metal and alloy Semiconductor |
|Soft matter Biologic Nanoparticles Magnetic Insulator |
|Thin film Multilayer |
| |
|Toxic Radioactive Biohazard |
| |
|Beam sensitive Air sensitive Sensitivity to polar solvents Sensitivity to |
|apolar solvents |
| |
|Chemical composition:____________________________________________________________|
| |
|______________________________________________________________________________ |
|______________________________________________________________________________ |
| |
|Crystal structure information: |
|- is the crystal structure known: Yes No |
|Unit cell parameters (in е): |
|a = ________________; b = _______________________; c = |
|_____________________________ |
|alpha = _______________; beta = ____________________; gamma = |
|______________________ |
|Crystal system: _________________________ |
|Space group: ___________________________ |
| |
|For known crystal structure, provide the list of atomic coordinates: |
| |
|Modulated structure Composite structure |
|Provide crystallographic information (max 1/2 page): |
| |
|Other relevant information (max 1/2 page): |

6. Preliminary characterization.
|Provide brief summary of the sample characterization by other techniques (i.e. |
|XRD, NPD, spectroscopy, compositional analysis, SEM etc) |
| |