[1] G.A. Soli, H.B. Garrett and E.R. Fossum, "CMOS
Charged Particle Spectrometers", IEEE Trans. Nuc. Sci., vol. 43, pp.1516-1520, June
1996.
[2] M.G. Buehler, B.R. Blaes, G.A. Soli and G.R. Tardio, "On-Chip
p-MOSFET Dosimetry" IEEE Trans. Nuc. Sci., vol. 40, pp.1442-1449, December 1993.
[3] R.H. Nixon, S.E. Kemeny, B. Pain, C.O. Staller and E.R. Fossum,
"256X256 CMOS Active Pixel Sensor Camera-on-a-Chip", IEEE J. Solid State Circ.,
vol. 31, pp.2046-2050, December 1996.
[4] E. R. Fossum and B. Pain, "Infrared Readout Electronics for
Space-Science Sensors: State of the Art and Future Directions", Infrared Technology
XIX, Proc. SPIE, vol. 2020, p.262, 1993.
[5] J.D. Garnett and W.J. Forrest, "Multiply Sampled Read Limited
and Background Limited Noise Performance", Infrared Detectors and Instrumentation,
Proc. SPIE, vol. 1946, pp.395-404, 1993.
[6] H. Zulliger and D. Aitken, "Fano Factor Fact and
Fallacy", IEEE Trans. Nuc. Sci., vol.17, p.197, 1970.
[7] See, for example: T.P. Ma and P.V. Dressendorfer, Ionizing
Radiation Effects in MOS Devices and Circuits, New York: John Wiley and Sons, 1989.
[8] T.L. Meisenheimer and D.M. Fleetwood, "Effect of
Radiation-Induced Charge on 1/f Noise in MOS Devices", IEEE Trans. Nuc. Sci., vol.
37, pp.1696-1702, December 1990.
[9] J.C. Boudenot and B. Augier, "Total Dose Effects on CCDs
– Reverse Annealing Phenomena", Proc. ESA Electr. Comp. Conf., Noordwijk, NL,
12-16 Nov., 1990, ESA SP313 (March 1991), pp.319-324.
[10] G.R. Hopkinson, C.J. Dale and P.W. Marshall, "Proton Effects
in Charge-Coupled Devices", IEEE Trans. Nuc. Sci., vol. 43, pp.614-627, April 1996.
[11] I.H. Hopkins and G.R. Hopkinson, "Further Measurements of
Random Telegraph Signals in Proton Irradiated CCDs", IEEE Trans. Nuc. Sci, vol. 42,
pp.2074-2081, December 1995.
