 
XMM-Newton Science Analysis System
epevents (epevents-6.43) [xmmsas_20080701_1801-8.0.0]
 
 
 
 
 
 
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Pattern related information
The following table may serve as a quick reference to select certain pattern
types of recognized events (i.e. away from CCD edges, bad pixels etc.):
| PATTERN | Meaning | 
| 0 | singles | 
| 1 | doubles in Y with Y(main)  Y(secondary) | 
| 2 | doubles in X with X(main)  X(secondary) | 
| 3 | doubles in Y with Y(main)  Y(secondary) | 
| 4 | doubles in X with X(main)  X(secondary) | 
| 5-8 | triples | 
| 9-12 | quadruples | 
| 128 | singles at CCD window (RAWX=1, RAWX=64, RAWY=200) | 
|  | or close to bad pixels | 
| 205 | doubles at CCD window or bad pixels | 
| 206 | triples at CCD window or bad pixels | 
| 207 | quadruples at CCD window or bad pixels | 
 
Note: as of version 6.30.4 PATTERN values of 128 have been changed to 0
(i.e.  bit is not set anymore for singles), and PATTERN values 
of 205 have been changed to 1-4 
(i.e.
 bit is not set anymore for singles), and PATTERN values 
of 205 have been changed to 1-4 
(i.e.  and
 and  bit are not set anymore for doubles)!
 bit are not set anymore for doubles)!
Secondary events of those valid doubles, triples, and quadruples
(
 ) have
) have 
 (as listed above),
i.e.
 (as listed above),
i.e.  bit set.
 bit set.
- For the pattern codes in PAT_ID and PATTERN 
    the following bit-wise storing is used: 
 
 
| PAT_ID |  | bit | value | Meaning |  | 16 | 32768 | free for additional pattern related flag |  | 15 | 16384 | - " - |  | 14 | 8192 | - " - |  | 13 | 4096 | PAT_ORI first digit (x-coordinate) |  | 12 | 2048 | - " - |  | 11 | 1024 | PAT_ORI second digit (y-coordinate) |  | 10 | 512 | - " - |  | 9 | 256 | PAT_IND:  (telemetry limit) |  | ... | ... | - " - |  | 1 | 1 | - " - |  
 
 
| PATTERN |  | bit | value | Meaning |  | 8 | 128 | sign of PAT_TYP |  | 7 | 64 | sign of PAT_IND |  | 6 | 32 |  | used to flag PAT_TYP  |  | 5 | 16 |  | if bit 6, then use next 5 bits |  | 4 | 8 | MOS code numbers 0 - 12 | to store PAT_TYP - 5 |  | 3 | 4 | a combination of | hence, max storage: PAT_TYP = 36 |  | 2 | 2 | PAT_TYP  and | - " - |  | 1 | 1 | PAT_ORI | - " - |  
 
Note: as of version 6.30.4 PATTERN values of 128 have been changed to 0
(i.e.  bit is not set anymore for singles), and PATTERN values 
of 205 have been changed to 1-4 
(i.e. bit is not set anymore for singles), and PATTERN values 
of 205 have been changed to 1-4 
(i.e. and and bit are not set anymore for doubles)! bit are not set anymore for doubles)!
 
 
- Creation of event quality flags in column FLAG. 
  epevents
makes use of the common MOS/pn event related flag code 
  (see [3]) and uses the following bits 
  (other flags are set by the epframes
task):
 
 
| FLAG |  | bit | value | Meaning (information) |  | 1 | 0x2 | INVALID_PATTERN |  | 2 | 0x4 | CLOSE_TO_CCD_WINDOW |  | 5 | 0x20 | CLOSE_TO_ONBOARD_BADPIX |  | 6 | 0x40 | CLOSE_TO_BRIGHTPIX (not on-board) |  | 8 | 0x100 | CLOSE_TO_DEADPIX (not on-board) |  | 16 | 0x10000 | OUT_OF_FOV |  
 
 
| bit | value | Meaning (rejection) |  | 19 | 0x80000 | COSMIC_RAY |  | 21 | 0x200000 | ON_BADPIX |  | 22 | 0x400000 | SECONDARY |  | 23 | 0x800000 | TRAILING |  | total | 0xfa0000 | EPN rejection mask |  
 
 
 
 
 
 
 
 
XMM-Newton SOC/SSC -- 2008-07-02