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http://www.mrao.cam.ac.uk/projects/OAS/pmwiki/uploads/MROIDelayLine.InterfaceControl/INT-406-VEN-0012.pdf,1254758327.
http://www.mrao.cam.ac.uk/projects/OAS/pmwiki/uploads/MROIDelayLine.InterfaceControl/INT-406-VEN-0012.pdf,1254758327.
1. http://www.mrao.cam.ac.uk/projects/OAS/pmwiki/uploads/MROIDelayLine.InterfaceControl/INT-406-VEN-0012.pdf
Metrology System to Beam Combining Facility ICD INT-406-VEN-0012 v0.4.doc Page 1 of 16 MRO Delay Line ICD Metrology System to Beam Combining Facility ICD INT-406-VEN-0012 The Cambridge Delay Line Team rev 0.4 5 October 2009 Cavendish Laboratory JJ Thomson Avenue Cambridge CB3 0HE UK Metrology System to Beam Combining Facility ICD INT-406-VEN-0012 v0.4.doc Page 2 of 16 1 ICD Description Sub-systems Metrology BCF ... 9.3 Cabling Table 2 Cabling between metrology system components. ...
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Ссылки http://www.mrao.cam.ac.uk/projects/OAS/pmwiki/uploads/MROIDelayLine.InterfaceControl/INT-406-VEN-0012.pdf -- 560.7 Кб -- 05.10.2009
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2. http://www.mrao.cam.ac.uk/projects/aavp/posters/daSilva_AAVP-Cambridge2010.pdf
... The design employs a differential structure. ... The input is adapted to 100 differential, and the outputs use standard Low Voltage Differential Signaling (LVDS). ... T/H SINGLE T/H Single Input T/H Single Output 1.35 0.15 0.2 T/H DIFFERENTIAL Input T/H Output T/H 0.1 1.3 0.05 volts volts Figure 5: Digital part and digital gate 0 1.25 -0.05 -0.1 1.2 Integrated Test System A test system is integrated on chip to evaluate the transmission to the data acquisition card (fig: 7). ...
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Ссылки http://www.mrao.cam.ac.uk/projects/aavp/posters/daSilva_AAVP-Cambridge2010.pdf -- 1772.7 Кб -- 06.12.2010
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