Документ взят из кэша поисковой машины. Адрес оригинального документа : http://num-meth.srcc.msu.ru/english/zhurnal/tom_2003/v4r104.html
Дата изменения: Tue Feb 13 15:57:49 2007
Дата индексирования: Mon Oct 1 22:36:09 2012
Кодировка:
"On one inverse problem of quantitative electron probe microanalysis"  
"On one inverse problem of quantitative electron probe microanalysis"
D.V. Zot'ev, M.N. Filippov, and A.G. Yagola

     A method for the tracer-free experimental determination of the function generating the in-depth characteristic X-ray used for evaluation of component concentrations in electron probe microanalysis is considered. Application of our method brings about to an inverse problem for a Fredholm equation of the first kind. An algorithm for solving this problem is proposed; the algorithm is based on the information given a priori and physical restrictions imposed on the sought-for function.

D.V. Zot'ev, A.G. Yagola     e-mail: yagola@inverse.phys.msu.ru; ill-posed@mail.ru
M.N. Filippov     e-mail: fil@igic.ras.ru