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: - (, ) - - In situ

3/04/2012
1





d =-


i

( i d i )

d = + d ln s

()

~ 1015 /2

~ 10-9 /2




2


-
. .., , ., , 1964, III.

=

max



( E )c =


1-



exp(-2a )
!

( )

a = -2g

3


Furier-transformed infrared spectroscopy (FTIRS) ­ - -

In situ
- : - second harmonic generation (SHG) ­ ; - surface enhanced Raman scattering (SERS) ­ ()

Electromodulation infrared spectroscopy (EMIRS) ­ Subtraction normalized infrared spectroscopy (SNIFTIRS) ­ c Surface enhanced infrared absorption spectroscopy (SEIRAS) ­

200 ­ 4000 -1

350 ­ 800



4


100% 1% 10%

H2
5


: SNIFTIRS

( )

­ max

6


SERS
monochromatic light source (laser)
Laser filter Multichannel detector

sample

Spectrometer

( c)

7


- (PNBA)

SEIRAS

10 ng PNBA

Ag/Ge

Ge

100 ng PNBA

8


: SEIRAS

9

CHEMPHYSCHEM (2001) 617-619


, ( 0.6 )





10








-

11


Sum frequency generation (SFG)

-

+
12

Rep. Prog. Phys. 68 (2005) 1095­1127


SAM - c (self-arranged) SH- (thiol terminated) ­ : - - «»

:


13


in situ
STM ­ scanning tunneling microscopy ( ) AFM ­ atomic force microscopy (- ) EXAFS ­ extended X-ray absorption fine structure ( ) XANES ­ X-ray absorption near edge structure ( ) **************************** XRD, ND ­ X-ray and neutron diffraction ( ) DEMS ­ differential electrochemical mass-spectroscopy ( -) EQCM (EQCN) ­ electrochemical quartz crystal micro(nano)balance (14 - )


: SS
+ Br
-



Au

15


EQCM (EQCN) ­ electrochemical quartz crystal micro(nano)balance ( - ) fo
3.34*104 / ( )



tq

tq + t
fo +

f





Chem. Rev. 92 (1992) 1355 - 1379
16


: EQCM,

:

SiW12

Cu

[SiW12O40]4- (SiW12)

Cu SiW12

17


In situ : ( )

7.8

:

18


Au(111)

Au(100) : - - - 15x15 2

Langmuir 19 (2003) 830 Langmuir 15 (1999) 2435



19


- (14, 12) HOPG

Materials Science and Engineering R 70 (2010) 169­187

20


- Electrochim Acta 43 (1998) 2991-3006

21


/ - - -1

J Electroanal Chem 62 (1975) 11-20

22




()





?
,

23




800
24